Nanophotonics Group

Prof. Xiaolong Hu

中文 / English

New publication: Enhancement of silicon sub-bandgap photodetection by helium-ion implantation

In collaboration with researchers from the University of Science and Technology of China, Huazhong University of Science and Technology, and Zhejiang University-UIUC Institute, our group used a helium-ion microscope to implant helium ions into silicon with appropriate doses to improve the performance of photodetectors based on sub-bandgap optical absorption effects.

 

URL: https://link.springer.com/article/10.1007/s12200-023-00096-x